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Customized Fixtures

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The fixtures have been customized according to the customer’s test requirements:

1User-defined backplane/connector, domestic and foreign discrete resistance, capacitance and inductance devices, self-developed chips, cables and other test fixtures

2Conform to the test standard and accurately measure the performance of the customer's object to be tested 

3TRL/ISD/AFR and other methods can be selected according to the test scenario, which can remove the impact of the fixture. The embedding accuracy: back loss -40dB@67GHz, insertion loss ± 0.1dB@67GHz


Domestic discrete device test fixture

Domestic discrete device test fixture

5G antenna connector clamp test

5G antenna connector clamp test

Embedded Precision & Test Precision

Comparison of De-Embedding Methods

Comparison of De-Embedding Methods

The Device Under Test (DUT) measurement of the product can be realized by using a variety of different embedding methods, which can ensure more accurate results

TRL Calibration Accuracy

TRL Calibration Accuracy

TRL de-embedding accuracy shall be 50Ghz+, IL shall be less than ± 0.1db, and RL shall be less than - 35db.

Imitation Calibration Case

Simulation test fitting with SMA head

Simulation test fitting with SMA head

Insertion loss back loss fitting

Insertion loss back loss fitting

TDR impedance fitting

TDR impedance fitting